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university:tools:m1k:analog-mux [30 Dec 2020 17:17] – add sparkfun links Doug Mercer | university:tools:m1k:analog-mux [03 Jan 2021 22:21] – fix links Robin Getz | ||
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There are other analog multiplexer configurations in the generic CD4XXX series of CMOS ICs. The CD4051 is a single 8:1 mux and the CD4067 is a single 16:1 mux. The old Motorola MC14529B analog selector can be a configured as a dual 4-channel or single 8-channel device depending on how the input controls are used. By using 3 or all 4 of the digital PIO bits and two of these single multiplexers either 16 or even 32 signal channels could be measured. These two mux breakout boards are available from SparkFun, the [[https:// | There are other analog multiplexer configurations in the generic CD4XXX series of CMOS ICs. The CD4051 is a single 8:1 mux and the CD4067 is a single 16:1 mux. The old Motorola MC14529B analog selector can be a configured as a dual 4-channel or single 8-channel device depending on how the input controls are used. By using 3 or all 4 of the digital PIO bits and two of these single multiplexers either 16 or even 32 signal channels could be measured. These two mux breakout boards are available from SparkFun, the [[https:// | ||
- | Another functionally similar option is the [[http:// | + | Another functionally similar option is the [[adi>media/ |
While the generic CD4052 is lower cost than the ADG609, there are two main advantages of using the ADG609 over the CD4052. The ADG609 on resistance maximum spec is 30 ohms, where the CD4052 on resistance maximum spec is 240 ohms and the 74HC4052 on resistance maximum spec is 120 ohms. This higher resistance could cause errors and distortions in the measurements under certain conditions. | While the generic CD4052 is lower cost than the ADG609, there are two main advantages of using the ADG609 over the CD4052. The ADG609 on resistance maximum spec is 30 ohms, where the CD4052 on resistance maximum spec is 240 ohms and the 74HC4052 on resistance maximum spec is 120 ohms. This higher resistance could cause errors and distortions in the measurements under certain conditions. |