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resources:technical-guides:surge [12 Aug 2022 17:41] – s valerie hamiltonresources:technical-guides:surge [09 Sep 2022 12:07] (current) – s valerie hamilton
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-====Surge Test Results====+====AD74115H Surge Test Results====
 The surge immunity test indicates the capability of the device or equipment to survive surges caused by events such as lightning strikes or industrial power surges caused by switching heavy loads or short-circuit fault conditions. The surge immunity test indicates the capability of the device or equipment to survive surges caused by events such as lightning strikes or industrial power surges caused by switching heavy loads or short-circuit fault conditions.
  
-Per the IEC 61000-4-5 standard for industrial environments, the surge is a combination wave of 1.2 μs rising time with 50 μs pulse width open circuit voltage and 8 μs rising time with 20 μs pulse width short-circuit current. The EUT is subject to five positive and five negative surges at each rating. The interval between each surge is 1 min. The surge is tested to the AD74115H output cable, which is treated as unshielded asymmetrically operated interconnection lines of the EUT. The surge is applied to the I/O and sense lines through CDN 117.+Per the IEC 61000-4-5 standard for industrial environments, the surge is a combination wave of 1.2 μs rising time with 50 μs pulse width open circuit voltage and 8 μs rising time with 20 μs pulse width short-circuit current. The DUT (Device under test) is subject to five positive and five negative surges at each rating. The interval between each surge is 1 min. The surge is tested to the AD74115H output cable, which is treated as unshielded asymmetrically operated interconnection lines of the DUT. The surge is applied to the I/O and sense lines through CDN 117.
  
-The CDNs do not influence the specified functional conditions of the EUT. The interconnection line between the EUT and the CDN is 2 m in length or shorter+The CDNs (coupling decoupling network) do not influence the specified functional conditions of the DUT. The interconnection line between the DUT and the CDN is 2 m in length or shorter
  
 ===Table 1 IEC 61000-4-5 Surge Test Levels=== ===Table 1 IEC 61000-4-5 Surge Test Levels===
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 ===Hardware Configuration=== ===Hardware Configuration===
-The use cases tested during surge testing were voltage output (and by default voltage input), internal digital output sourcing and sinking. The external sense pins SENSE_EXT1 and SENSE_EXT2 were also subject to testing. The reasoning for these particular use cases were to ensure the integrity of the I/O and sense screw terminals along with the internal fets used for the internal digital output use case. The surge was coupled to each screw terminal one at a time with respect to IO_N (AGND). Unshielded cable was used for all use cases.+The use cases tested during surge testing were voltage output (and voltage input by reconfiguring the ADC input nodes), internal digital output sourcing and sinking. The external sense pins SENSE_EXT1 and SENSE_EXT2 were also subject to testing. The reasoning for these particular use cases were to ensure the integrity of the I/O and sense screw terminals along with the internal fets used for the internal digital output use case. The surge was coupled to each screw terminal one at a time with respect to IO_N (AGND). Unshielded cable was used for all use cases.
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resources/technical-guides/surge.1660318897.txt.gz · Last modified: 12 Aug 2022 17:41 by valerie hamilton

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