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resources:eval:user-guides:circuits-from-the-lab:cn0368 [30 Mar 2015 20:47] – [Single Temperature Calibration] Neil Wilson | resources:eval:user-guides:circuits-from-the-lab:cn0368 [30 Mar 2015 21:22] – [Multiple Temperature Calibration] Neil Wilson | ||
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==== Multiple Temperature Calibration ==== | ==== Multiple Temperature Calibration ==== | ||
+ | The Multiple Temperature Calibration procedure is a method of compensating for temperature effects experienced by the amplifier and ADC. The temperature coefficients and offsets are calculated to provide a more accurate magnetic field angle and system response. | ||
+ | - Select // | ||
+ | - Place the hardware in a temperature controlled environment at the desired T1. | ||
+ | - {{: | ||
+ | - Press // | ||
+ | - {{: | ||
+ | - Rotate the stimulus through 360 degrees while VSIN_Offset_T1 and VCOS_Offset_T1 are calculated. | ||
+ | - Press // | ||
+ | - {{: | ||
+ | - Place the hardware in a temperature controlled environment at the desired T2. | ||
+ | - Press // | ||
+ | - {{: | ||
+ | - Rotate the stimulus through 360 degrees while VSIN_Offset_T2 and VCOS_Offset_T2 are calculated. | ||
+ | - Press // | ||
+ | - Press //**Sample Data**// to observe the magnetic field angle results corrected for temperature and offset effects. | ||
==== Dynamic Calibration ==== | ==== Dynamic Calibration ==== | ||
The Dynamic Calibration method actively calculates VSIN_Offset and VCOS_Offset as the magnetic stimulus rotates through 360 degrees. | The Dynamic Calibration method actively calculates VSIN_Offset and VCOS_Offset as the magnetic stimulus rotates through 360 degrees. |