The EV-AD4170-ASD1Z-U1 evaluation kit features the AD4170, a multiplexed sigma delta analog to digital converter (ADC) 4.5nV/rtHz ultra low noise core, integrated PGA and programmable digital filter offering output data rates from 500ksps to 5sps.
The PC software fully configures the AD4170 device register functionality and provides AC time domain analysis in the form of waveform graphs, histograms, and associated noise analysis for ADC performance evaluation. The AC analysis is also provided by the software, examples of which are; an FFT displaying the first 5 harmonics SNR, SFDR S/N+D and THD.
The AD417x family of ADCs offers the highest integration and feature set required in the design of a multi-sensor measurement and is truly a platform measurement device, combining ac and dc performance that enables instrumentation and industrial system designers to design across multiple measurement requirements for both isolated and non-isolated applications.
All devices in the family offer excellent DC and AC performance. Where the AC performance is key, the input path is optimized to ensure the best performance can be captured. Here the integrated PGA can easily be bypassed if ultra low distortion measurement is required. The ultra low noise integrated PGA supports gains from X0,5 to X128, enabling an input span of +/- 2 * VREF/gain – See the PGA section for more details. The AD417x devices include a rich feature set from integrated low drift xppm/C reference, and key building blocks required for sensor excitation current and sensor biasing. The AD4172 has an an onboard programmable 12bit voltage out DAC that can also be used for sensor biasing or excitation, the family of parts offer an extremely robust and trusted measurement solution through the integration of a large number of of measurement diagnostics
The following steps highlight the process to begin using the evaluation board.
Visit the hardware guide chapter here
Contents of the Hardware guide: